Abstract
A merged beams technique has been used to investigate collisions between electrons and $\text{Si}_{2}{}^{\ensuremath{-}}$ ions over a relative kinetic energy range of 0--210 eV. Absolute cross sections for pure electron detachment, detachment plus dissociation, and dissociation involving atomic and ionic products were measured. The dominant process over the energy range studied is pure electron detachment. A search for a resonance associated with a ${\text{Si}}_{2}$ dianion was made but none was observed.
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