Single and double electron detachment cross sections for C − incident on helium

Abstract

With growth rate method, double electron detachment (DED) cross-sections for 4–15 keV H −+He are reported in this paper and are in agreement with other available experiment results. And for the first time, Single Electron Detachment (SED) cross-sections for 5–30 keV C −+He, Double Electron Detachment (DED) cross-sections for 5–15 keV C −+He are obtained in this work. The SED cross-sections at first increase as the incident ions energy increases, and then decrease as the energy is further increased in 5–30 keV. The DED cross-sections increase as the incident energy increases in the region 5–15 keV.