Abstract
Based on a combined analysis of spectroscopic ellipsometry, reflectance and transmittance measurements as well as spectrally resolved luminescence measurements and spectral responsivity measurements, we present data of the coefficient of band-to-band absorption of crystalline silicon at 295K in the wavelength range 250 – 1450nm. A systematic measurement uncertainty analysis according to the “Guide to the Expression of Uncertainty in Measurements” (GUM) is carried out for each method, showing that the relative uncertainty of the absorption coefficient data so determined is of the order of 0.3% at 300nm, 1% at 900nm, 10% at 1200nm and 180% at 1450nm. The data are consolidated by comparison of measurements carried out independently at different institutions. The uncertainty of solar cell energy conversion predictions by means of simulations due to the uncertainty of the absorption coefficient data is shown to be of the order of 0.1% relative.
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