Abstract
An interfacial layer (IL), about a nanometer thick, is produced by Sm deposition onto (001) CdTe grown by molecular-beam epitaxy. This IL is studied by reflection high-energy electron diffraction (RHEED), ion channeling, and x-ray diffraction. A correlation between the (1×2) RHEED pattern and the {111} CdTe stacking sequence is demonstrated, and is in favor of the surface Te dimerization hypothesis. Lattice location by ion channeling has revealed that incorporated Sm mainly occupies the octahedral site in the Te sublattice. A CdTe overlayer grown onto IL presents a remarkable feature, that is, a 90° rotation around the [001] direction with respect to the CdTe buffer. It was checked by ion channeling that the overlayer exhibited a bulklike crystallinity. Superlattices composed of many of these IL/CdTe basic periods have been grown at a temperature of 270 °C. The different experimental features are tentatively interpreted assuming the formation of an IL with the spinel structure.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
