Abstract
We have studied the surface roughness of CaF2 vacuum deposited on glass using atomic force microscopy for film coverages spanning an order of magnitude. We find the roughness exponent alpha=0.88+/-0.03, the growth exponent beta=0.75+/-0.03, and the dynamic exponent z=alpha/beta=1.17+/-0.06. Multifractality is also present, along with power-law behavior in the nearest neighbor height difference probability distribution. The results indicate noise dominated by a power-law distribution with exponent micro+1 approximately 4.6.
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