Evaluation of Uncertainty Measurement with Intelligent Contact Type Interferometer

Abstract

An evaluation is conducted to the uncertainty measurement with contact type interferometer after intellectualized improvement. CMOS sensing photographing technology and computer technology are applied to the improvement of contact type interferometer. A mathematical modeling is established by taking pixel number as reading unit and gauge block length comparative measurement method as means. The purpose is to analyze the source of measurement uncertainty, estimate the standard uncertainty of input, evaluate and set forth the expanded uncertainty. The result of evaluation is superior to the level of measurement uncertainty before improvement.