Evaluation of Fluorinated Self‐Assembled Monolayer by Photoelectron and Near Edge X‐Ray Absorption Fine Structure Spectroscopy

Abstract

SUMMARYThe electronic structure of fluorinated self‐assembled monolayers (F‐SAMs) with different chain lengths was investigated by photoelectron and near edge X‐ray absorption fine structure (NEXAFS) spectroscopy. From the measurements of the photoelectron spectra in the wide region and in the C 1s core‐level region, the chemical compositions and components of the F‐SAMs with different chain length were clarified. In the C K‐edge NEXAFS spectra of the F‐SAMs, the several spectral features were observed and the intensity of the features at 292 eV and 299 eV decreased with increasing incidence angle of the excitation photons. Based on the results of the photoelectron and NEXAFS spectral measurements, the electronic structure of four F‐SAMs with different chain length is discussed.