Evaluation of Fluorinated Self-assembled Monolayer by Using Photoelectron and Near Edge X-ray Absorption Fine Structure Spectroscopies

Abstract

The electronic structure of fluorinated self-assembled monolayers (F-SAMs) with different chain length was investigated by the using photoelectron and near edge X-ray absorption fine structure (NEXAFS) spectroscopies. From the measurements of the photoelectron spectra in the wide region and in the C 1s core-level region, chemical compositions and components of the F-SAMs with different chain length were clarified. In the C K-edge NEXAFS spectra of the F-SAMs, the several spectral features were observed and the intensity of the features at 292 and 299 eV decreased with increasing the incidence angle of the excitation photon. Based on the results of the photoelectron and NEXAFS spectra measurements, the electronic structure of four kinds of F-SAMs with different chain length is discussed.