Abstract
Journal Article Evaluation of Confocal X-ray Analysis for Single-Atom Detection in a Thin Specimen by an Advanced Analytical Electron Microscope Get access Masashi Watanabe, Masashi Watanabe Lehigh University, Bethlehem, Pennsylvania, United States Search for other works by this author on: Oxford Academic Google Scholar Ray Egerton Ray Egerton Department of Physics, University of Alberta, Edmonton, Alberta, Canada Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 26, Issue S2, 1 August 2020, Pages 1512–1514, https://doi.org/10.1017/S143192762001836X Published: 01 August 2020
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