Abstract
We describe the general overview of the most advanced analytical electron microscope (AEM) first, and especially explain the electron gun and objective lens as well as the spherical aberration corrector, which relate to the AEM performance. Next, we describe the image formation in the transmission electron microscope and scanning transmission electron microscope and analysis methods with energy dispersive spectroscopy and electron energy loss spectroscopy , which are indispensable for applying AEM to material science field. Lastly, we introduce how the AEM is utilized in the research of ceramics material concretely based on several application examples.
Published Version
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