Escape peaks and internal fluorescence in X-ray spectra recorded with lithium drifted silicon detectors

Abstract

Experimental measurements of the relative intensity of the escape peak produced in a Si(Li) X-ray detector agree quite well with a theoretical expression. The escape peak is not negligible in electron microprobe and X-ray fluorescence analysis. An approximate estimate of the size of the internal fluorescence Si K peak shows it to be small provided the detector dead layer is thin (0.1 mu m), and for most purposes it can be neglected.