Comparison between experimental and calculated relative escape peak intensities for an intrinsic Ge detector in the energy region 11–25 keV

Abstract

AbstractExperimental measurements of the relative intensity of the escape peak produced in an intrinsic Ge detector agree quite well with the calculated intensities based on a theoretical model. Contrary to the Si(Li) detector Kα as well as Kβ escape peaks are observed. In the energy region 11–25 keV the Ge Kα escape peak intensities vary from 16.3 to 4.7% and the Ge Kβ escape peak from 2.4 to 0.9% of that to the parent line. Therefore, the escape peaks are not negligible in X‐ray fluorescence analysis, and it may be necessary to numerically correct for them or, by a suitable choice of excitation energy, avoid them completely.