Abstract
Equivalent circuits corresponding to series solutions obtainable under various operating conditions of p- n junctions and solar cells are given. These circuits are directly applicable to the small signal impedance measurements. The transient behaviour of the p- n junction devices during minority carrier lifetime determination experiments has also been explained successfully with the help of these circuits. This provides a better insight towards the physical processes involved in these methods and interpretation of the various experimental results becomes easier.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
