Abstract
The open circuit voltage decay (OCVD) technique has been used to determine the minority carrier lifetime. In this study, an experimental and analytical method is described for determination of minority carrier lifetime at porous Si based solar cell by photo induced OCVD technique. The cell is illuminated by a monochromatic light source ( λ = 658 nm) in the open circuit configuration, and the decay of voltage is measured after abruptly terminating the excitation. For the analysis of the OCVD characteristic of solar cell device, equivalent electrical circuit has been proposed in which the diffusion capacitance is connected in series with the contribution of the solar cell interface. Exact minority carrier lifetimes at low (50–170 K) and high (190–330 K) temperature regions have been obtained as 28.9 and 2.65 μs from the temperature dependent OCVD measurements by using an alternative extraction technique.
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