Abstract
Publisher Summary This chapter discusses the theory of open-circuit voltage decay (OCVD) technique for the determination of excess carrier lifetime in p-n-junction single-crystal solar cells. It also discusses the OCVD obtained by electrical as well as optical injection of excess carriers. The OCVD is a popular technique for measurement of excess carrier lifetime in p-n-junction diodes. In a solar cell, the excess carriers can be injected electrically by a forward current or optically by illuminating it. OCVD technique is used in studying the switching behavior of diodes and solar cells and design of electronic pulse circuits, charge storage devices, and varactor diodes for frequency multiplication. Some limitations of the OCVD method for lifetime determination and small signal OCVD include variation of lifetime, diode factor and its variation, and high injection effects. The effect of high injection is to modify the excess carrier lifetime as well as the diode factor. In addition, it causes a saturation of the junction voltage.
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