Abstract
A technique for the equivalent circuit modeling of single and coupled uniform and nonuniform interconnects, including discontinuities such as bends and junctions in high-speed circuits and packages, is presented. The circuit models are extracted from time-domain reflection and transmission measurement (TDR/T). The SPICE simulated results for the extracted circuit models for typical single and coupled structures are compared with the measured data to validate the accuracy of the circuit models.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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