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PDF Availablehttps://doi.org/10.1109/tns.2010.2052068
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Cite Journal: IEEE Transactions on Nuclear Science |  Publication Date: Aug 1, 2010 |
 Citations: 7 |
Affiliation: MEI Technologies (United States)
A novel approach to dynamic SEE ADC testing is presented. The benefits of this test scheme versus prior implemented techniques include the ability to observe ADC SEE errors that are in the form of phase shifts, single bit upsets, bursts of disrupted signal composition, and device clock loss.
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