Abstract
A number of enhancements have been incorporated into the Livermore particle-induced X-ray emission (PIXE) spectral fitting program PIXEF (for PIXE-Fit) in order to improve our quantitative analysis capability for data collected with Si(Li) detectors. Some of the new features include an improved description for the background which takes into account X-ray absorption effects, a better representation of the line shapes using Voigtian distributions, and a better treatment of peak fitting in regions of poor counting statistics. The implementation of these improvements into PIXEF is described.
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