Abstract
The (Pb 0.90La 0.10)Ti 0.975O 3/PbTiO 3 (PLT/PT), PbTiO 3/(Pb 0.90La 0.10)Ti 0.975O 3/PbTiO 3 (PT/PLT/PT) multilayered thin films with a PbO x buffer layer were in situ deposited by RF magnetron sputtering at the substrate temperature of 600 °C. With this method, highly (1 0 0)-oriented PLT/PT and PT/PLT/PT multilayered thin films were obtained. The PbO x buffer layer leads to the (1 0 0) orientation of the films. The dielectric, ferroelectric and pyroelectric properties of the PLT multilayered thin films were investigated. It is found that highly (1 0 0)-oriented PT/PLT/PT multilayered thin films possess higher remnant polarization 2 P r (44.1 μC/cm 2) and better pyroelectric coefficient at room temperature p ( p = 2.425 × 10 −8 C/cm 2 K) than these of PLT and PLT/PT thin films. These results indicate that the design of the PT/PLT/PT multilayered thin films with a PbO x buffer layer should be an effective way to enhance the dielectric, ferroelectric and pyroelectric properties. The mechanism of the enhanced ferroelectric properties was also discussed.
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