Abstract

The interface between the organic semiconductor (OSC)/ferromagnetic (FM) material can exhibit ferromagnetism due to their orbital hybridization. Charge/spin transfer may occur from the FM to OSC layer leading to the formation of “spinterface,” i.e., the interface exhibiting a finite magnetic moment. In this work, the magnetic properties of the Co/C60 bilayer thin film have been studied to probe the interface between the Co and C60 layer. Polarized neutron reflectivity (PNR) measurement indicates that the thickness and moment of the spinterface are ∼2 ± 0.18 nm and 0.8 ± 0.2 μB/cage, respectively. The comparison of the magnetization reversal between the Co/C60 bilayer and the parent single layer Co thin film reveals that spinterface modifies the domain microstructure. Further, the anisotropy of the bilayer system shows a significant enhancement (∼two times) in comparison to its single layer counterpart which is probably due to an additional interfacial anisotropy arising from the orbital hybridization at the Co/C60 interface.

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