Abstract
Image processing and other multimedia applications require large embedded storage. In some of the earlier works approximate memory has been shown as a potential energy-efficient solution for such error-tolerant applications. In this brief, we propose a single ended 6-T (SE6T) static random access memory (SRAM) cell which has about 50% less dynamic power compared to conventional 6-T SRAM cell with the same bit error rate (BER). Since image processing applications are tolerant to errors, ultra low voltage power-efficient embedded memories with BER can be used for storage. We show that 1 KB ( $256 \times 32$ ) SE6T memory consumes $ {0.45\times }$ dynamic power, $ {0.83\times }$ leakage power and takes $ {0.60\times }$ area as compared to conventional 6T SRAM memory for similar peak signal to noise ratio (PSNR). We have also proposed heterogeneous SE6T 1K SRAM memory and show that for a given power budget, PSNR enhances by at least by 14 dB compared to when homogeneous (identically sized bit-cells) SE6T SRAM memory are used. When compared with heterogeneous 6T SRAM memory, the heterogeneous SE6T SRAM memory consumes $ {0.44\times }$ dynamic power, $ {0.86\times }$ leakage power and takes $ {0.6\times }$ area for almost similar PSNR. For a given PSNR, the SE6T memory is cumulatively better in terms of design complexity, area and power when compared with other hybrid and heterogeneous approximate memories.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
More From: IEEE Transactions on Circuits and Systems II: Express Briefs
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.