Abstract

We present kilohertz-scale video capture rates in a transmission electron microscope, using a camera normally limited to hertz-scale acquisition. An electrostatic deflector rasters a discrete array of images over a large camera, decoupling the acquisition time per subframe from the camera readout time. Total-variation regularization allows features in overlapping subframes to be correctly placed in each frame. Moreover, the system can be operated in a compressive-sensing video mode, whereby the deflections are performed in a known pseudorandom sequence. Compressive sensing in effect performs data compression before the readout, such that the video resulting from the reconstruction can have substantially more total pixels than that were read from the camera. This allows, for example, 100 frames of video to be encoded and reconstructed using only 15 captured subframes in a single camera exposure. We demonstrate experimental tests including laser-driven melting/dewetting, sintering, and grain coarsening of nanostructured gold, with reconstructed video rates up to 10 kHz. The results exemplify the power of the technique by showing that it can be used to study the fundamentally different temporal behavior for the three different physical processes. Both sintering and coarsening exhibited self-limiting behavior, whereby the process essentially stopped even while the heating laser continued to strike the material. We attribute this to changes in laser absorption and to processes inherent to thin-film coarsening. In contrast, the dewetting proceeded at a relatively uniform rate after an initial incubation time consistent with the establishment of a steady-state temperature profile.

Highlights

  • Transmission electron microscopy (TEM) is increasingly beset by data-throughput limitations, dictated in part by readout rates of TEM cameras

  • In situ TEM is an excellent platform for studying nanoscale material processes, but often these processes are too fast for conventional TEM cameras

  • Initial proof-of-principle tests were performed on the Dynamic Transmission Electron Microscope (DTEM) facility at the Lawrence Livermore National Laboratory (LLNL),[4,9] while the bulk of the results were generated using the In situ Ion Irradiation TEM (I3TEM) at Sandia National Laboratories (SNL), Albuquerque, equipped with a thermionic LaB6 electron source.[31]

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Summary

Introduction

Transmission electron microscopy (TEM) is increasingly beset by data-throughput limitations, dictated in part by readout rates of TEM cameras. Part of the reason is the rise of TEM techniques yielding data of more than two dimensions, with additional dimensions including time (dynamic, ultrafast, and in situ TEM), tilt angle or depth (tomography), energy (electron energy loss, energy-dispersive x-ray, and cathodoluminescence spectrum imaging), and two-dimensional scattering angles [the field most generally called 4D-STEM, including scanning TEM (STEM) diffraction, orientation imaging, electron ptychography, and some forms of fluctuation electron microscopy].1–7. These operating modes demand extreme data throughput and can be severely limited by a given instrument’s data capture bottleneck.

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