Abstract

The electronic structure of thin films of the organic semiconductor vanadyl phthalocyanine has been studied using synchrotron radiation-excited resonant soft X-ray emission spectroscopy, resonant inelastic soft X-ray scattering, X-ray absorption spectroscopy, and X-ray photoemission spectroscopy. The C, N, V, and O partial densities of states for both the valence and conduction bands have been determined, as well as the core level electronic structure. Good agreement was found between the experimental measurements of the valence and conduction bands, and the results of a density functional calculation.

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