Abstract
The electronic structure of thin films of the prototypical organic semiconductor copper phthalocyanine (CuPc) has been measured using resonant soft X-ray emission spectroscopy. We report the observation of two discrete states near E F. This differs from published photoemission results, but is in excellent agreement with density functional calculations. The implications of this result for the use of resonant soft X-ray emission (SXE) in the study of organic semiconductors are discussed. We also compare our data to published X-ray emission results, and show that the latter display clear evidence of beam damage.
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