Abstract
Over the past decade, the developments of electron ptychography have revolutionized electron microscopy in the characterization of the atomic structure of matter. Ptychography is a computational imaging technique that has no limits imposed by lens aberrations, thereby offering a spatial resolution well beyond the traditional numerical-aperture-limited resolution with the added benefit of quantitatively accessing and solving the phase of the electron waves. In this review, we summarize the most commonly used ptychographic algorithms and optical configurations, and highlight the recent applications and latest advanced developments. We further discuss the future of multidimensional electron ptychography in combination with other microscopic capabilities, heralding a new era in the characterization of engineered and biological materials.
Published Version
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