Abstract
Electron microscope observations were made of phase growth in Al/Ag evaporated thin film diffusion couples. Only one phase formed and was identified as Ag 2Al by selected area electron diffraction. There was some evidence for grain boundary diffusion along the aluminium grains. This is limited because of the low solubility of silver in aluminium. There was no evidence of grain boundary diffusion in the intermediate phase in which the principle diffusion processes occur. Phase growth showed a parabolic dependence on time and an Arrhenius plot enabled an activation energy of 1.01 eV to be established for the growth process.
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