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Abstract
A versatile method of measuring electro-optic coefficients (rij: i=4–6 and j=1–3) of isometric, uniaxial, and biaxial crystals without crystal coordinate rotation has been developed. It has been confirmed theoretically and experimentally that the change in the retardation of an X-cut Y-propagation LiNbO3 crystal depends on the square of the electric field along the X-direction. The constant stress electro-optic coefficient r51 of the LiNbO3 crystal is found to be 32.05±0.01 pm/V at 632.8 nm.
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