Abstract
Abstract X-ray diffraction studies of Cu 6 AsS 5 I crystals grown using the chemical vapor transport method are performed. Complex electrical conductivity, impedance, dielectric permittivity, and electrical modulus of Cu 6 AsS 5 I crystal are studied in wide frequency range and temperature interval from 100 to 400 K. Different contributions into electrical conductivity spectra are revealed. Two phase transitions are confirmed for Cu 6 AsS 5 I from the frequency and temperature dependencies of electrical properties.
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