Abstract
Electric modulus formalism was used to study relaxation processes in the 0.75‐mol%‐La2O3‐doped CeO2 system between 387 and 470 K in the frequency range 5 to 107 Hz. Two relaxation processes were observed in the isothermal studies: one at low frequencies due to long‐range migration of free oxygen vacancies (process A) and one at high frequencies due to charge reorientation relaxation of (LaCeVo’defect associates (process B). The relaxation processes were analyzed using a nonexponential decay function (φ(t) = exp[—(t/τoβ] for 0<β1) of the electric field. The activation enthalpy estimated for process A is 0.72 eV and for process B is 0.55 eV.
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