Abstract
In this paper, we present a novel procedure to test and diagnose faults in large scale analogue circuits. Large change sensitivity analysis is used to obtain diagnostic voltages and currents. Decomposition technique is applied and algorithms for isolation of faulty nodes, faulty connections and faulty subcircuits are proposed. The hardware overhead problem is considered and it leads to an optimization of test nodes. The circuit analysis is based on a new symbolic technique which is less costly than traditional methods in terms of time complexity. One benchmark circuit is performed and the results show the efficiency of this method.
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