Efficient Defect Classification Using Few-Shot Image Generation and Self-Attention Fused Convolution Features

Abstract

Although deep learning has been proven to significantly outperform most traditional methods in the classification of large-scale balanced image datasets, collecting enough samples for defect classification is extremely time-consuming and costly. In this paper, we propose a lightweight defect classification method based on few-shot image generation and self-attention fused convolution features. We constructed a 4-class dataset using welding seam images collected from a solar cell module packaging production line. To address the issue of limited defect samples, especially for classes with less than 10 images, we implemented two strategies. Geometric enhancement techniques were first used to extend the defective images. Secondly, multi-scale feature fusion Generative Adversarial Networks (GANs) were utilized to further enhance the dataset. We then performed the feature-level fusion of convolution neural networks and self-attention networks, achieving a classification accuracy of 98.19%. Our experimental results demonstrate that the proposed model performs well in small sample defect classification tasks. And, it can be effectively applied to product quality inspection tasks in industrial production lines.