Abstract
Large energy shifts in the luminescence emission from strained InGaAs quantum dots are observed as a result of postgrowth annealing and also when raising the upper cladding layer growth temperatures. These blueshifts occur concurrently with narrowing (from 61 to 24 meV) of the full width at half-maxima for the emission from the quantum dot ensemble. These energy shifts can be explained by interdiffusion or intermixing of the interfaces rather than strain effects due to variations in capping layer thickness. Temperature behavior of the luminescence in annealed and nonannealed samples indicates a change in the shape and depth of the quantum dot confining potential. Quenching of the wetting layer luminescence after interdiffusion is also observed.
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