Abstract
Electropulsing induced phase transformation and crystal orientation change and their effects on electrical conductivity, THz reflection and surface roughness of thin-films of Al2O3 (2 wt%) doped ZnO were studied using XRD, SEM, AFM and Thz spectroscopy techniques. AZO-2 thin-films showed an effective response in THz spectroscopy under electropulsing. Electropulsing induced circular preferred crystal orientation changes and phase transformations were observed. The preferred crystal orientation changes accompanying decrease in stress and the secondary phase precipitation favored enhancing conductivity and THz reflection of the AZO-2 thin-films. After adequate electropulsing, both THz reflection and electrical conductivity of the thin-films were enhanced by 22.8% and 6.8%, respectively; meanwhile surface roughness reduced. The property responses of electropulsing are discussed from point view of microstructural change and dislocation dynamics.
Highlights
IntroductionTransparent Conductive Oxide (TCO) thin-films such as In2O3, SnO2 and ZnO have been widely studied for
Transparent Conductive Oxide (TCO) thin-films such as In2O3, SnO2 and ZnO have been widely studied forHow to cite this paper: Zhu, Y.H. and Lai, W.E. (2016) Effects of Electropulsing Induced Microstructural Changes on THzReflection and Electrical Conductivity of Al-Doped ZnO Thin-Films
A reverse transformation of the preferred crystal orientation and decomposition of the Al-precipitate occurred. This meant that, both circular preferred crystal orientation and the phase transformation occurred during 20 mins of electropulsing
Summary
Transparent Conductive Oxide (TCO) thin-films such as In2O3, SnO2 and ZnO have been widely studied for. (2016) Effects of Electropulsing Induced Microstructural Changes on THzReflection and Electrical Conductivity of Al-Doped ZnO Thin-Films. As an advanced process, Electropulsing Treatment (EPT) has been proved to be a very effective process for improving the microstructures of materials and their properties [14]-[25]. Compared with the non-EPT thin-films of Zn-Al alloy (ZA27) and thermoelectric (Bi0.25Sb0.75)2Te3 semiconductor, electropulsing increases electrical conductivity by 18.2% and 28.6%, respectively [20] [21]. It was reported that compared with that achieved in the conventional ageing, electropulsing tremendously accelerated phase transformations and microstructural changes by factors of at least 6000 and 3400 times for Zn-Al and Al-Mg alloys, respectively [22]-[24]. Physical properties such as THz reflection, electrical conductivity and surface roughness of the thin-films of an Al-doped ZnO are studied by using electropulsing
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