Electropulsing-induced microstructure evolution and its effect on electrical conductivity of (Bi0.25Sb0.75)2Te3 thin films

Abstract

Electropulsing-induced microstructure evolution of thermoelectric (Bi0.25Sb0.75)2Te3 thin films was studied by X-ray diffraction, scanning electron microscopy and Hall effect measurement techniques. Electropulsing-induced circular phase transformations and crystal orientation changes were detected and related to the changes in electrical conductivity of the thin films. After adequate electropulsing, the electrical conductivity of the thin films increased by about 28.5%. The effects of electropulsing on electrical conductivity are discussed in terms of decomposition of metastable semiconductor and dislocation dynamics.