Abstract
This study investigates the effects of Co-60 gamma-ray irradiation on the DC and RF characteristics of the SiGe HBTs, with a total dose of up to 4000 krad(Si). The degradation of the forward base current is primarily attributed to surface recombination due to the induced interface traps. The ideality factor of the forward excess base current is affected by the positive oxide-trapped charges at the interface of the emitter-base spacer oxide. TCAD simulation results indicate that the effective integral region of the surface recombination rate is associated with the positive oxide-trapped charge density. The accumulation of positive oxide-trapped charges in the shallow trench isolation oxide has an impact on the potentials of the interface and epi-collector region, subsequently affecting the base diffusion current. Therefore, the ideality factor of the reverse excess base current depends on the device geometry. The RF characterization suggests that the depletion capacitance of the base-emitter junction is more susceptible to gamma-ray irradiation compared to the base-collector junction. And the cut-off frequency experiences a slight degradation as the total dose increases.
Published Version
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