Abstract

Abstract Selective diamond films on roughened Si(100) substrates with patternings have been achieved by microwave plasma chemical vapor deposition (MP-CVD). The films have been characterized by scanning electron microscopy (SEM) and Raman spectra. The influence of substrate temperature on the selective deposition of diamond films has been discussed in detail: the diamond nucleation density on the SiO2 mask increased with substrate temperature while the effect of the selective deposition of diamond films deteriorated; the optimized deposition temperature conditions have been concluded.

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