Abstract
We have studied changes in the dielectric properties of thin lead zirconate titanate Pb(Zr,Ti)O3 (PZT) films, obtained using a two-stage ex-situ technology, as dependent on the microstructure of a perovskite phase and the content of microinclusions of excess lead oxide. The presence of these microinclusions leads to either anomalously low or high values of dielectric permittivity and anomalous pyroelectric response.
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