Effect of invasive probes on measurement of magneto-transport in macroscopic samples: A gallium nitride case study

Abstract

Small changes in electrical conductance of quasi-2 dimensional samples often need to be measured at low temperatures, T∼1K and lower. Care needs to be taken to minimize self-heating due to the excitation current itself and the possibility of any unexpected source of variation of the electrochemical potential around the contacts need to be understood. It is not only the low resistance of the ohmic contacts but also their “noninvasive” character that must be ensured. While the importance of the “noninvasiveness” of the voltage probes is well appreciated for mesoscopic devices—it turns out that these considerations continue to remain important even in macroscopic samples that are a few millimeters in size. We have done low temperature measurements on different types of gallium nitride samples with contacts made of pure indium (popularly called indium dots), which have a superconducting transition and contacts made of Ti/Au, which remain nonsuperconducting. We show that there are qualitative differences in the measured four-terminal resistance in the two cases. Obviously, correct conclusions about phase relaxation times, localization lengths, etc., will require ensuring that there are no effects arising from the “invasiveness” of the probes.