Abstract
Oriented La 0.7Sr 0.3MnO 3 (LSMO) films were grown on (100) LaAlO 3 (LAO) and SrTiO 3 (STO) substrates by the method of radio frequency magnetron sputtering. X-ray diffraction patterns of LSMO films deposited on LAO and STO substrates showed a slight shift of diffraction peaks as compared to the corresponding peaks of the bulk LSMO. The shift of diffraction peaks was believed to result from the in-plane lattice mismatch between the film and substrate. The distinguished strain effects of substrates were found to be effective on the magnetic properties and the surface morphology of LSMO films on both substrates. The results indicate that STO substrate may be the promising candidate for room-temperature applications of LSMO film.
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