Abstract
Thin films of CuTPP were prepared by thermal evaporation techniques. X-ray diffraction technique, Infrared spectra and scanning electron microscope were used to investigate the crystalline structure and morphologies of CuTPP thin films before and after annealing. The optical properties of the as-deposited and annealed CuTPP thin films were investigated by using spectrometric measurements at nearly normal incidence of light in the wavelength range 200–2500 nm. The type of electronic transition and the optical energy gap were estimated by using the obtained data of the absorption index, k, for the as-deposited and annealed CuTPP films. The third order nonlinear susceptibility was estimated for as-deposited and annealed CuTPP thin films. The dispersion parameters and the real and imaginary parts of dielectric constant were also calculated.
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