Editorial

Abstract

This issue of Journal of Physics D: Applied Physics sees the launch of a new section dedicated to the applied aspects of interface and surface science. The articles included in the section, in this, and in forthcoming issues reflect the growing practical importance of this field. The development of techniques for controlling growth and investigating characteristics of interfaces and surfaces has led to the creation of a wide range of devices whose performance may be highly dependent on interface and surface properties. With the introduction of the Applied Interfaces and Surfaces section we hope to provide a forum tailored to the needs of scientists concerned with all aspects of this field, thus reflecting the interdisciplinary nature of the subject. The section is intended to complement the Surface and Interface Science section of Journal of Physics: Condensed Matter, which covers the fundamental aspects of this field. The Applied Interfaces and Surfaces section particularly invites papers on the topics listed below. Emphasis will be given to research relating to practical techniques for the growth, analysis and characterization of surfaces and interfaces, and on the effects of surface and interface properties on devices and applications. Practical aspects of the growth of interfaces, surfaces and thin films Nanoscale mechanical properties of interfaces and residual stresses Thermal treatment of surfaces Techniques for the preparation of surfaces Techniques for the analysis and characterization of surfaces and interfaces, such as AES, SIMS, STM, TEM, AFM, etc Surface modification using plasmas and other techniques Given its aims and scope, I am particularly pleased to launch this new section with a collection of papers from the recent International Symposium on Atomic Bonding at Internal Interfaces: Modelling and Spectroscopy. This meeting was held at the conference site of the Max-Planck-Gesellschaft and the conference organizers have kindly provided an introduction to the resulting papers that can be found on the next page. This collection of papers demonstrates that the combination of modern experimental techniques with sophisticated theoretical modelling is providing the understanding of internal interfaces which is a prerequisite for obtaining control of their properties. In addition to a number of regular research articles, also appearing in this first issue is an Invited Article by John McGilp, the scientist who coined the generic term, EPIOPTICS, for the family of optical probe techniques that have considerable potential for the study of interfaces and surfaces. I trust that you will enjoy this first appearance of the Applied Interfaces and Surfaces section. I believe that this is a field of great importance and I am sure that the new section will bring together more high quality research in the forthcoming issues of the journal. Peter Weightman Editor, Applied Interfaces and Surfaces