Development of a lifting wavelet representation for surface characterization

Abstract

Restricted accessMoreSectionsView PDF ToolsAdd to favoritesDownload CitationsTrack Citations ShareShare onFacebookTwitterLinked InRedditEmail Cite this article Jiang X. Q., Blunt L. and Stout K. J. 2000Development of a lifting wavelet representation for surface characterizationProc. R. Soc. Lond. A.4562283–2313http://doi.org/10.1098/rspa.2000.0613SectionRestricted accessResearch articleDevelopment of a lifting wavelet representation for surface characterization X. Q. Jiang X. Q. Jiang Centre for Precision Technologies, School of Engineering, University of Huddersfield, Huddersfield HD1 3DH, UK Google Scholar Find this author on PubMed Search for more papers by this author , L. Blunt L. Blunt Centre for Precision Technologies, School of Engineering, University of Huddersfield, Huddersfield HD1 3DH, UK Google Scholar Find this author on PubMed Search for more papers by this author and K. J. Stout K. J. Stout Centre for Precision Technologies, School of Engineering, University of Huddersfield, Huddersfield HD1 3DH, UK Google Scholar Find this author on PubMed Search for more papers by this author X. Q. Jiang X. Q. Jiang Centre for Precision Technologies, School of Engineering, University of Huddersfield, Huddersfield HD1 3DH, UK Google Scholar Find this author on PubMed Search for more papers by this author , L. Blunt L. Blunt Centre for Precision Technologies, School of Engineering, University of Huddersfield, Huddersfield HD1 3DH, UK Google Scholar Find this author on PubMed Search for more papers by this author and K. J. Stout K. J. Stout Centre for Precision Technologies, School of Engineering, University of Huddersfield, Huddersfield HD1 3DH, UK Google Scholar Find this author on PubMed Search for more papers by this author Published:08 September 2000https://doi.org/10.1098/rspa.2000.0613AbstractThis paper reviews the existing numerical analysis methods and their problems in surface metrology. Based on the requirements of functional analysis of surfaces, this paper proposes a lifting wavelet representation for extraction of different components of a surface. The theory of the lifting wavelet is introduced and a fast algorithm is developed. Different frequency components of the surface can be separated, extracted and then reconstructed according the intended requirements of functional analysis. The surface textures can be highlighted and multi–scalar topographical features can be identified and clearly recovered. In order to verify the behaviour of the new model, a computer simulation based on sinusoidal and triangular waveforms is used. Case studies are conducted using a series of typical surfaces of engineering and bioengineering, such as planes, cylinders and curves, measured by contact (stylus) and non–contact (phase–shifting interferometry) instruments, to demonstrate the feasibility and applicability of using the lifting wavelet model in the analysis of these surfaces. Previous Article VIEW FULL TEXT DOWNLOAD PDF FiguresRelatedReferencesDetailsCited by Shao Y, Xu F, Chen J, Lu J and Du S (2023) Engineering surface topography analysis using an extended discrete modal decomposition, Journal of Manufacturing Processes, 10.1016/j.jmapro.2023.02.005, 90, (367-390), Online publication date: 1-Mar-2023. 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