Abstract
This work addresses the frequent discrepancy between transient photoconductive (PC) decay and transient photoluminescence (PL) decay. With this dual- sensor technique, one measures the transient PC and PL decay simultaneously with the same incident light pulse, removing injection-level uncertainty. Photoconductive decay measures the transient photoconductivity, Δσ(t). PCD senses carriers released from shallow traps as well as the photo-generated electron-hole pairs. In addition, variations in carrier mobility with injection level (and time) contribute to the decay time. PL decay senses only electron-hole recombination via photon emission. Theory and experiment will show that the time dependence of the two techniques can be quite different at high injection.
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