Abstract
This paper focuses on the radiation-induced dose and single-event effects (SEEs) on a color CMOS camera designed for space missions. The γ -ray and proton tests are used to evaluate the tolerance against cumulative dose effects. The dark current of the image sensor is the main parameter impacted by dose effects. Heavy ions testing is performed to evaluate SEEs. single-event upset, single-event functional interrupt, and single-event latchup have been observed and mitigation techniques were proposed for specific space missions.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
