Abstract
This work proposed and discussed a serial JESD204B data receiver and conducted a single event effect test on it. The test is used to analyzed the Single Event Upset (SEU), single Event Latch-up (SEL) and Single Event Functional Interrupt (SEFI). The purpose of the test is to determine if single event effect caused the chip to crash or increase the on-track error rate. The results show that the circuit has a strong ability to resist Single event effect.
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