Abstract
Angular resolved X-ray photoelectron spectroscopy (ARXPS) has been applied to obtain the distribution of chemical elements near the surface of non-aqueous solutions containing surfactants. However, such profiles can only yield a quantitative relation between those constituents near the surface regime of sample. With the knowledge of the molar volumes of surfactant and solvent, we have obtained the molar concentration-depth profiles via the molar fraction-depth profiles that were reconstructed by ARXPS with the help of a generic algorithm. The concentration profiles show detailed distributions of the surfactant ions near the surface, which provide a direct insight into the surface picture of the surfactant solution.
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