Abstract
Depth profiles of the passive films on stainless steel were based on analysis with the non-destructive hard X-ray photoelectron spectroscopy (HAXPES) technique in combination with the angular resolved X-ray photoelectron spectroscopy (ARXPS). The analysis depth with ARXPS is within the passive film thickness, while the HAXPES technique uses higher excitation energies (between 2 and 12keV) also non-destructively probing the chemical content underneath the film. Depth profiles were done within and underneath the passive film of 316L polarized in acidic solution.The passive film thickness was estimated to 2.6nm for a sample that was polarized at 0.6V and the main component in the passive film is, as expected, chromium. From the high resolution HAXPES spectra we suggest chromium in three different oxidation states present. Also for iron three oxides were detected. Gradients of chromium and iron concentrations and oxidation states within the film and an enrichment of nickel within a 0.5nm layer directly underneath the passive film are some of the results discussed.
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
