Abstract
A new method of determining the lateral structure of crystal surfaces is described. The dispersion of electronic surface resonances at energies of the order of 10 eV above the vacuum level is measured, and the results are interpreted using a nearly free-electron method to determine low-index Fourier coefficients of the potential acting on electrons near the surface. The method is shown to reproduce the known lateral structure of $\mathrm{Ni}(001)c(2\ifmmode\times\else\texttimes\fi{}2)\mathrm{O}$ surface.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
