Direct sampling method for anomaly imaging from scattering parameter

Abstract

In this paper, we develop a fast imaging technique for small anomalies located in homogeneous media from S-parameter data measured at dipole antennas. Based on the representation of S-parameters when an anomaly exists, we design a direct sampling method (DSM) for imaging an anomaly and establishing a relationship between the indicator function of DSM and an infinite series of Bessel functions of integer order. Simulation results using synthetic data at f=1GHz of angular frequency are illustrated to support the identified structure of the indicator function.