Localization of Small Anomalies via the Orthogonality Sampling Method from Scattering Parameters

Seongje Chae,Won-Kwang Park,Chi Young Ahn

doi:10.3390/electronics9071119

Abstract

We investigate the application of the orthogonality sampling method (OSM) in microwave imaging for a fast localization of small anomalies from measured scattering parameters. For this purpose, we design an indicator function of OSM defined on a Lebesgue space to test the orthogonality relation between the Hankel function and the scattering parameters. This is based on an application of the Born approximation and the integral equation formula for scattering parameters in the presence of a small anomaly. We then prove that the indicator function consists of a combination of an infinite series of Bessel functions of integer order, an antenna configuration, and material properties. Simulation results with synthetic data are presented to show the feasibility and limitations of designed OSM.

Highlights

Localization or imaging of unknown targets from measured scattered fields or scattering parameter data is an old but interesting inverse scattering problem
For the background permittivity and conductivity values, the parameters are set to ε rb = 20 and σb = 0.2 S/m, respectively, at f = 1.2 GHz, and Ω was selected as a ball of radius 0.08 m centered at the origin with a step size r for evaluating f orthogonality sampling method (OSM) (r, m) set to
We designed and applied OSM to identify the locations of small anomalies from measured scattered field S-parameters

Summary

Introduction

Localization or imaging of unknown targets from measured scattered fields or scattering parameter data is an old but interesting inverse scattering problem. This problem has a wide range of applications, for example, breast-cancer detection in biomedical imaging [1,2,3], anti-personnel mine detection, synthetic aperture radar (SAR), ground penetrating radar (GPR) in geoscience and remote sensing [4,5,6], and damage detection in civil structures [7,8,9]. It is well known that the successful performance of an iteration-based scheme depends strongly on starting the iteration procedure with a good initial guess [14,15]. Various non-iterative algorithms have been investigated for this purpose and successfully applied to various inverse scattering problems

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Conclusion